Dr. Nina V. Dziomkina
at ASML Netherlands BV
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 17 April 2014 Paper
Carmen Zoldesi, Kursat Bal, Brian Blum, Guus Bock, Derk Brouns, Florian Dhalluin, Nina Dziomkina, Juan Diego Arias Espinoza, Joost de Hoogh, Silvester Houweling, Maarten Jansen, Mohammad Kamali, Alain Kempa, Ronald Kox, Robert de Kruif, Jorge Lima, Yang Liu, Henk Meijer, Hans Meiling, Ijen van Mil, Marco Reijnen, Luigi Scaccabarozzi, Daniel Smith, Beatrijs Verbrugge, Laurens de Winters, Xugang Xiong, John Zimmerman
Proceedings Volume 9048, 90481N (2014) https://doi.org/10.1117/12.2049276
KEYWORDS: Pellicles, Extreme ultraviolet, Semiconducting wafers, Reticles, Prototyping, Silicon, Manufacturing, Particles, Critical dimension metrology, Protactinium

Proceedings Article | 1 April 2013 Paper
Luigi Scaccabarozzi, Dan Smith, Pedro Rizo Diago, Eric Casimiri, Nina Dziomkina, Henk Meijer
Proceedings Volume 8679, 867904 (2013) https://doi.org/10.1117/12.2015833
KEYWORDS: Pellicles, Extreme ultraviolet, Particles, Reticles, Extreme ultraviolet lithography, Neodymium, Semiconducting wafers, Scanners, Manufacturing, Ultraviolet radiation

Proceedings Article | 5 April 2011 Paper
Arun Kumar Gnanappa, Evangelos Gogolides, Emilien Feuillet, Fabrizio Evangelista, Nina Dziomkina, Michel Riepen
Proceedings Volume 7973, 79732C (2011) https://doi.org/10.1117/12.881605
KEYWORDS: Semiconducting wafers, Polymethylmethacrylate, Liquids, Water, Satellites, Plasma, Capillaries, Immersion lithography, Thin films, Oxygen

Proceedings Article | 27 August 2005 Paper
Nina Dziomkina, Mark Hempenius, G. Julius Vancso
Proceedings Volume 5931, 59310Z (2005) https://doi.org/10.1117/12.614867
KEYWORDS: Crystals, Electrodes, Particles, Crystallography, Polymers, Scanning electron microscopy, Optical lithography, Photonic crystals, Dielectrics, Lithography

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