Pavel Koval
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 October 2012 Paper
Proceedings Volume 8507, 85071K (2012) https://doi.org/10.1117/12.929017
KEYWORDS: Manganese, Thin films, Crystals, Sensors, Optical properties, X-rays, Solids, Diffraction, Semiconductors, Crystallography

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