Dr. Robert W. Herrick Profile

Dr. Robert W. Herrick

Consultant

SPIE Involvement:

Author

Area of Expertise:

VCSEL Reliability , Semiconductor Laser Reliability , Optoelectronic Reliability , VCSEL Failure analysis , Semiconductor Laser Failure Analysis , Control of Electrostatic Discharge

Profile Summary

Have worked in most areas of semiconductor laser fabrication and test, including modeling, design, fabrication, process development, reliability testing, and failure analysis. Ph.D. in VCSEL reliability and failure analysis; have published many of the papers available on those subjects. Have worked for most of the US VCSEL suppliers, including HP/Agilent (now Avago), Finisar (formerly Honeywell / AOCD), Emcore, and JDSU (formerly Picolight). Primarly expertise in semiconductor laser reliability testing and failure analysis; secondary expertise in fiber optic transceiver reliability testing and in electrostatic discharge control.

Publications (19)

Proceedings Article | 15 March 2023 Presentation + Paper

Presentation + Paper

Improving the reliability of InAs quantum-dot laser diodes for silicon photonics: the role of trapping layers and misfit-dislocation density

Matteo Buffolo, Michele Zenari, Carlo De Santi, Chen Shang, Eamonn Hughes, Yating Wan, John Bowers, Robert Herrick, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

Proceedings Volume 12440, 1244002 (2023) https://doi.org/10.1117/12.2652046

KEYWORDS: Quantum dot lasers, Semiconductor lasers, Reliability, Indium arsenide, Silicon photonics

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Proceedings Article | 4 March 2022 Presentation + Paper

Presentation + Paper

Optical degradation of InAs quantum-dot lasers on silicon: dependence on temperature and on diffusion processes

Matteo Buffolo, Michele Zenari, Carlo De Santi, Justin Norman, John Bowers, R. Herrick, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

Proceedings Volume 12021, 1202108 (2022) https://doi.org/10.1117/12.2607340

KEYWORDS: Diffusion, Temperature metrology, Silicon, Indium arsenide, Semiconductor lasers, Beryllium, Gallium arsenide, Gallium, Reliability, Laser applications

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Proceedings Article | 5 March 2021 Presentation + Paper

Presentation + Paper

Impact of dislocation density on performance and reliability of 1.3 μm InAs quantum dot lasers epitaxially grown on silicon

Matteo Buffolo, Lorenzo Rovere, Carlo De Santi, Justin Norman, John Bowers, R. Herrick, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

Proceedings Volume 11705, 117050K (2021) https://doi.org/10.1117/12.2579347

KEYWORDS: Silicon, Semiconductor lasers, Reliability, Indium arsenide, Quantum dot lasers, Active optics, Statistical analysis, Silicon photonics, Quantum dots, Gallium arsenide

Read Abstract +

Proceedings Article | 26 February 2020 Presentation + Paper

Presentation + Paper

Epitaxial integration of high-performance quantum-dot lasers on silicon

Justin Norman, Songtao Liu, Yating Wan, Zeyu Zhang, Chen Shang, Jennifer Selvidge, Mario Dumont, M. J. Kennedy, Daehwan Jung, Jianan Duan, Heming Huang, Robert Herrick, Frederic Grillot, Arthur Gossard, John Bowers

Proceedings Volume 11285, 1128504 (2020) https://doi.org/10.1117/12.2542912

KEYWORDS: Silicon, Semiconductor lasers, Quantum dots, Gallium arsenide, Silicon photonics, Laser applications, Reliability, Quantum wells, Quantum dot lasers, Crystals

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Proceedings Article | 24 February 2020 Presentation + Paper

Presentation + Paper

Demonstration of current-dependent degradation of quantum-dot lasers grown on silicon: role of defect diffusion processes

Matteo Buffolo, Fabio Samparisi, Carlo De Santi, Daehwan Jung, Justin Norman, John Bowers, Robert Herrick, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

Proceedings Volume 11301, 113010L (2020) https://doi.org/10.1117/12.2545901

KEYWORDS: Silicon, Diffusion, Semiconductor lasers, Gallium arsenide, Gallium, Electroluminescence, Quantum efficiency, Quantum dots, Photonic integrated circuits, Semiconducting wafers

Read Abstract +

Proceedings Article | 1 March 2019 Paper

Paper

Degradation mechanisms of InAs quantum dot 1.3 um laser diodes epitaxially grown on silicon

Matteo Buffolo, Fabio Samparisi, Carlo De Santi, Daehwan Jung, Justin Norman, John Bowers, Robert Herrick, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

Proceedings Volume 10939, 109390P (2019) https://doi.org/10.1117/12.2509277

KEYWORDS: Semiconductor lasers, Quantum dots, Reliability, Silicon photonics

Read Abstract +

Proceedings Article | 18 September 2018 Presentation + Paper

Presentation + Paper

High performance quantum dot lasers epitaxially integrated on Si

Justin Norman, Zeyu Zhang, Daehwan Jung, Yating Wan, M. J. Kennedy, Alfredo Torres, Robert Herrick, Arthur Gossard, John Bowers

Proceedings Volume 10771, 107710D (2018) https://doi.org/10.1117/12.2319627

KEYWORDS: Silicon, Transparency, Quantum dot lasers, Semiconductor lasers, Quantum dots, Absorption, Gallium arsenide, Gallium, Doping, Silicon photonics

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Proceedings Article | 13 March 2013 Paper

Paper

Reliability and degradation of oxide VCSELs due to reaction to atmospheric water vapor

Alexandru Dafinca, Anthony Weidberg, Steven McMahon, Alexander Grillo, Philippe Farthouat, Michael Ziolkowski, Robert Herrick

Proceedings Volume 8639, 86390L (2013) https://doi.org/10.1117/12.2001195

KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Corrosion, Failure analysis, Humidity, Epoxies, Sensors, Transmission electron microscopy, Reliability, Dielectrics

Read Abstract +

Proceedings Article | 16 June 2004 Paper

Paper

Reliability of oxide VCSELs at Emcore

Christopher Helms, Ian Aeby, Wenlin Luo, Robert Herrick, Albert Yuen

Proceedings Volume 5364, (2004) https://doi.org/10.1117/12.539282

KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Reliability, Failure analysis, Manufacturing, Transceivers, Mirrors, Electroluminescence, Transmission electron microscopy, Semiconducting wafers

Read Abstract +

Proceedings Article | 17 June 2003 Paper

Paper

Characterization of failure mechanisms for oxide VCSELs

Scott McHugo, A. Krishnan, Joachim Krueger, Yong Luo, Ningxia Tan, Tim Osentowski, Suning Xie, Myrna Mayonte, Robert Herrick, Qing Deng, Mike Heidecker, David Eastley, Mark Keever, Christophe Kocot

Proceedings Volume 4994, (2003) https://doi.org/10.1117/12.482637

KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Optical inspection, Failure analysis, Electroluminescence, Reliability, Metals, Contamination, Humidity, Transmission electron microscopy

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Proceedings Article | 17 June 2003 Paper

Paper

Reliability and failure mechanisms of oxide VCSELs in nonhermetic environments

Suning Xie, Robert Herrick, Gregory De Brabander, Wilson Widjaja, Uli Koelle, An-Nien Cheng, Laura Giovane, Frank Hu, Mark Keever, Tim Osentowski, Scott McHugo, Myrna Mayonte, Seongsin Kim, Danielle Chamberlin, S. Jeffrey Rosner, Grant Girolami

Proceedings Volume 4994, (2003) https://doi.org/10.1117/12.480281

KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Reliability, Humidity, Failure analysis, Semiconducting wafers, Electroluminescence, Transmission electron microscopy, Semiconductors, Oxidation

Read Abstract +

Proceedings Article | 4 June 2002 Paper

Paper

Oxide VCSEL reliability qualification at Agilent Technologies

Robert Herrick

Proceedings Volume 4649, (2002) https://doi.org/10.1117/12.469227

KEYWORDS: Reliability, Vertical cavity surface emitting lasers, Transceivers, Oxides, Semiconducting wafers, Resistance, Manufacturing, Temperature metrology, Packaging, Data communications

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Proceedings Article | 1 May 2000 Paper

Paper

Highly reliable oxide VCSELs manufactured at HP/Agilent Technologies

Robert Herrick, Sui Lim, Hongyu Deng, Qing Deng, Jim Dudley, Mark Keever, Tchang-Hun Oh, Melissa Li, M. Tashima, Lee Hodge, Xiaolong Zhang, John Herniman, Pete Evans, Bing Liang, Chun Lei

Proceedings Volume 3946, (2000) https://doi.org/10.1117/12.384365

KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Reliability, Temperature metrology, Manufacturing, Thermal modeling, Fiber optics, Electroluminescence, Fiber optics tests, Oxidation

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Proceedings Article | 29 April 1999 Paper

Paper

Reliability of vertical-cavity lasers at Hewlett-Packard

Robert Herrick, Chun Lei, Mark Keever, Sui Lim, Hongyu Deng, Jim Dudley, Jay Bhagat

Proceedings Volume 3627, (1999) https://doi.org/10.1117/12.347106

KEYWORDS: Vertical cavity surface emitting lasers, Reliability, Semiconducting wafers, Oxides, Failure analysis, Compact discs, Data communications, Semiconductor lasers, Annealing, Electroluminescence

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Proceedings Article | 29 April 1999 Paper

Paper

850-nm oxide VCSEL development at Hewlett-Packard

Hongyu Deng, James Dudley, Sui Lim, Chun Lei, Bing Liang, M. Tashima, Lee Hodge, Xuemei Zhang, John Herniman, Robert Herrick

Proceedings Volume 3627, (1999) https://doi.org/10.1117/12.347103

KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Reliability, Manufacturing, Fiber optic communications, Epitaxy, Semiconducting wafers, Eye, Control systems, Oxidation

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Proceedings Article | 10 April 1996 Paper

Paper

Analysis of VCSEL degradation modes

Robert Herrick, Michael Cheng, James Beck, Pierre Petroff, Jeff Scott, Matthew Peters, Gerald Robinson, Larry Coldren, Robert Morgan, Mary Hibbs-Brenner

Proceedings Volume 2683, (1996) https://doi.org/10.1117/12.237683

KEYWORDS: Vertical cavity surface emitting lasers, Mirrors, Luminescence, Electroluminescence, Reliability, Reflectivity, Quantum wells, Laser damage threshold, Gallium arsenide, Near field scanning optical microscopy

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Proceedings Article | 2 June 1994 Paper

Paper

High wall-plug efficiency temperature-insensitive vertical-cavity surface-emitting lasers with low-barrier p-type mirrors

Matthew Peters, D. Bruce Young, Frank Peters, Brian Thibeault, Jeff Scott, Scott Corzine, Robert Herrick, Larry Coldren

Proceedings Volume 2147, (1994) https://doi.org/10.1117/12.177201

KEYWORDS: Mirrors, Vertical cavity surface emitting lasers, Doping, Gallium arsenide, Resistance, Interfaces, Quantum wells, Beryllium, Reflectivity

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Proceedings Article | 1 June 1994 Paper

Paper

Two-dimensional scaling of ridge waveguide amplifiers

Kun No, Robert Herrick, Christopher Leung, Robert Rhinehart, Joseph Levy

Proceedings Volume 2148, (1994) https://doi.org/10.1117/12.176648

KEYWORDS: Optical amplifiers, Waveguides, Diffraction, Amplifiers, Oscillators, Modulators, Near field, Control systems, Semiconductor lasers, Collimation

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Proceedings Article | 1 May 1990 Paper

Paper

10-amplifier coherent array based on active-integrated optics

Mark Zediker, Howard Appelman, Bradford Clay, Jeffrey Heidel, Robert Herrick, John Haake, Joseph Martinosky, F. Streumph, Richard Williams

Proceedings Volume 1219, (1990) https://doi.org/10.1117/12.18257

KEYWORDS: Laser applications, Waveguides, Mirrors, Optical amplifiers, Semiconducting wafers, Near field, Integrated optics, Etching, Nickel, Photomasks

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Showing 5 of 19 publications

Proceedings Volume Editor (2)

SPIE Conference Volume | 16 April 2002

Test and Measurement Applications of Optoelectronic Devices

SPIE Conference Volume | 16 April 2002

Test and Measurement Applications of Optoelectronic Devices

Conference Committee Involvement (2)

Testing and Reliability of Optoelectronic Devices

22 January 2002 | San Jose, California, United States

Test and Measurement Applications of Optoelectronic Devices

21 January 2002 | San Jose, California, United States

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