Prof. Shinji Ando Profile

Prof. Shinji Ando

at Tokyo Institute of Technology

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Author

Publications (5)

Proceedings Article | 12 February 2009 Paper

Organic/inorganic-polyimide nanohybrid materials for advanced opto-electronic applications

Shinji Ando

Proceedings Volume 7213, 72130B (2009) https://doi.org/10.1117/12.814976

KEYWORDS: Refractive index, Silver, Polymers, Absorption, Silica, Magnesium fluoride, Thin films, Thermal optics, Polarizers, Metals

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Proceedings Article | 12 February 2008 Paper

Thermally stable multi-mode polymer optical waveguide fabricated by single-step photo-patterning of fluorinated polyimide/epoxy hybrids

Yuichi Urano, Ningjuan Chen, Kaichiro Nakano, Katsumi Maeda, Shinji Ando

Proceedings Volume 6891, 68910P (2008) https://doi.org/10.1117/12.760870

KEYWORDS: Ultraviolet radiation, Waveguides, Refractive index, Epoxies, Polymers, Polymer multimode waveguides, FT-IR spectroscopy, Nitrogen, Channel waveguides, Thermal effects

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Proceedings Article | 2 March 2006 Paper

Green-light emission of ZnO nanoparticles spontaneously precipitated in fluorinated polyimide films

Anongnat Somwangthanaroj, Akiko Matsumura, Shinji Ando

Proceedings Volume 6122, 61220E (2006) https://doi.org/10.1117/12.654752

KEYWORDS: Zinc oxide, Zinc, Nanoparticles, Luminescence, Transmission electron microscopy, Metals, Optical properties, Oxides, Absorbance, Polymers

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Proceedings Article | 4 May 2005 Paper

A new 193nm resist

Toshiaki Fukuhara, Taku Hirayama, Yuji Shibasaki, Shinji Ando, Mitsuru Ueda, Masayuki Endo, Masaru Sasago

Proceedings Volume 5753, (2005) https://doi.org/10.1117/12.598342

KEYWORDS: Polymers, Transparency, Photoresist materials, Magnesium, Polymerization, Infrared spectroscopy, Chlorine, Spectroscopy, Vacuum ultraviolet, Chemically amplified resists

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Proceedings Article | 4 April 2005 Paper

Control of thermo-optic coefficients and their polarization dependence in polyimide films formed on Si substrates

Yoshiharu Terui, Shinji Ando

Proceedings Volume 5724, (2005) https://doi.org/10.1117/12.590116

KEYWORDS: Polarization, Silicon, Thermal optics, Refractive index, Birefringence, Waveguides, Polymers, Temperature metrology, Polymethylmethacrylate, Polymer thin films

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