Travis Ayers
President at Luxel Corporation
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 9 September 2019 Paper
Proceedings Volume 11127, 111272C (2019) https://doi.org/10.1117/12.2529762
KEYWORDS: Graphene, Sensors, Carbon, Scanning electron microscopy, Scattering, Time of flight imaging, Time of flight cameras

Proceedings Article | 9 September 2019 Paper
Proceedings Volume 11118, 111181P (2019) https://doi.org/10.1117/12.2529755
KEYWORDS: Aluminum, Optical filters, Transmittance, Oxidation, Signal attenuation, X-rays, Ultraviolet radiation, Infrared radiation

SPIE Journal Paper | 26 February 2018 Open Access
Caroline Kilbourne, Joseph Adams, Petar Arsenovic, Travis Ayers, Meng Chiao, Michael DiPirro, Megan Eckart, Ryuichi Fujimoto, John Kazeva, Kari Kripps, Bruce Lairson, Maurice Leutenegger, Heidi Lopez, Daniel McCammon, Daniel McGuinness, Kazuhisa Mitsuda, Samuel Moseley, F. Scott Porter, Andrea Schweiss, Yoh Takei, Rosemary Thorpe, Tomomi Watanabe, Noriko Yamasaki, Seiji Yoshida
JATIS, Vol. 4, Issue 01, 011215, (February 2018) https://doi.org/10.1117/12.10.1117/1.JATIS.4.1.011215
KEYWORDS: Optical filters, X-rays, Spectroscopy, Silicon, Thin films, Sensors, Interfaces, Contamination, Fermium, Frequency modulation

Proceedings Article | 11 July 2016 Paper
Caroline Kilbourne, Joseph Adams, Petar Arsenovic, Travis Ayers, Meng Chiao, Michael Dipirro, Megan Eckart, Ryuichi Fujimoto, John Kazeva, Richard Kelley, Kari Kripps, Bruce Lairson, Maurice Leutenegger, Heidi Lopez, Dan McCammon, Daniel McGuinness, Kazuhisa Mitsuda, Samuel Moseley, F. Porter, Andrea Schweiss, Yoh Takei, Rosemary Thorpe, Tomomi Watanabe, Noriko Yamasaki, Seiji Yoshida
Proceedings Volume 9905, 99053Q (2016) https://doi.org/10.1117/12.2232240
KEYWORDS: X-rays, Field effect transistors, Sensors, Resistors, Calibration, Lead, Gold, Helium, Epoxies, Connectors

Proceedings Article | 29 July 2010 Paper
Bruce Lairson, Dave Grove, Ryan Smith, Heidi Lopez, Travis Ayers, Brennan Gantner, Matthew Beasley
Proceedings Volume 7732, 77322G (2010) https://doi.org/10.1117/12.857739
KEYWORDS: Indium, Plasma, Semiconducting wafers, Contamination, Extreme ultraviolet, Argon, Absorption, Carbon, Visible radiation, Oxygen

Showing 5 of 6 publications
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