Prof. Ulli Pietsch
at Univ Siegen
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 16 December 2020 Presentation + Paper
Dieter Schlosser, Robert Hartmann, Alois Bechteler, Peter Holl, M. Shokr, Ullrich Pietsch, Lothar Strueder
Proceedings Volume 11444, 114442R (2020) https://doi.org/10.1117/12.2575676
KEYWORDS: Spatial resolution, X-rays, Scintillators, Sensors, Imaging spectroscopy, Spectroscopy, Imaging systems, X-ray imaging, Image resolution, Silicon

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