Emissivity is one of the important parameters to reflect the thermal characteristics of the surface of an object. It plays a great role in the research of infrared coatings with high or low emissivity. In this paper, a novel non-contact experimental method is proposed to measure the coating’s emissivity using the dual-temperature method, and the error of the measured infrared emissivity with different base board materials is analyzed.
Pulse phase thermography (PPT), principal component thermography (PCT) method and Thermal signal reconstruction (TSR) analysis including Logarithmic First-Derivative (LFD) and Logarithmic Second-Derivative (LSD) method have been widely used to improve detection sensitivity and quantitative measurement accuracy in infrared thermal imaging. In this paper, the difference of pulsed thermography results of aluminum specimens with flat bottom holes (FBHs) under PPT method, PCT method and LFD and LSD method was compared. With the result of the above methods, the multi-image average method is proposed to further improve the signal-to-noise ratio at the defect of images. Finally, the difference between the original result and the improved result are compared.
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