Prof. Yohannes Abate Profile

Prof. Yohannes Abate

at Univ of Georgia

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Author

Publications (4)

Proceedings Article | 8 March 2019 Presentation

Reconfigurable infrared hyperbolic metasurfaces using phase-change materials (Conference Presentation)

Thomas Folland, Alireza Fali, Samuel White, Joseph Matson, Neda Aghamiri, Song Liu, James Edgar, Richard Haglund, Yohannes Abate, Joshua Caldwell

Proceedings Volume 10927, 109271F (2019) https://doi.org/10.1117/12.2508068

KEYWORDS: Infrared radiation, Infrared materials, Dielectrics, Phonons, Polaritons, Wave propagation, Heterojunctions, Boron, Crystals, Vanadium

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Proceedings Article | 2 November 2016 Presentation

Infrared nanoscopy of In-rich InGaN epilayers (Conference Presentation)

Daniel Seidlitz, Alireza Fali, Indika Matara Kankanamge, Dorian Alden, Ramon Collazo, Axel Hoffmann, Nikolaus Dietz, Yohannes Abate

Proceedings Volume 9954, 995408 (2016) https://doi.org/10.1117/12.2238043

KEYWORDS: Indium gallium nitride, Infrared radiation, Near field scanning optical microscopy, Dielectrics, Near field optics, Heterojunctions, Infrared imaging, Spectroscopy, Imaging spectroscopy, Super resolution microscopy

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Proceedings Article | 7 September 2016 Paper

Effect of AlN buffer layers on the structural and optoelectronic properties of InN/AlN/Sapphire heterostructures grown by MEPA-MOCVD

Indika M. K., Daniel Seidlitz, Alireza Fali, Brendan Cross, Yohannes Abate, Nikolaus Dietz

Proceedings Volume 9954, 99540R (2016) https://doi.org/10.1117/12.2237957

KEYWORDS: Plasma, Optoelectronics, FT-IR spectroscopy, Indium nitride, Aluminum nitride, Sapphire, Nitrogen, Raman spectroscopy, Atomic force microscopy, Dielectrics

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Proceedings Article | 8 September 2015 Paper

Optoelectronic and structural properties of InGaN nanostructures grown by plasma-assisted MOCVD

Daniel Seidlitz, M. K. Senevirathna, Y. Abate, A. Hoffmann, N. Dietz

Proceedings Volume 9571, 95710P (2015) https://doi.org/10.1117/12.2188612

KEYWORDS: Plasma, Indium nitride, Indium gallium nitride, Raman spectroscopy, Nitrogen, FT-IR spectroscopy, Molybdenum, Optoelectronics, Near field scanning optical microscopy, Dielectrics

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