Prof. Hee Chul Lee Profile

Prof. Hee Chul Lee

Professor at KAIST

SPIE Involvement:

Author

Publications (38)

Proceedings Article | 14 May 2019 Paper

Residual stress analysis of anodic aluminum oxide thin films for infrared emitter device application

Young Bong Shin, Hee Chul Lee

Proceedings Volume 11001, 110011A (2019) https://doi.org/10.1117/12.2518815

KEYWORDS: Aluminum, Thin films, Resistors, Infrared imaging, Infrared sensors, Sputter deposition, Semiconducting wafers, Infrared radiation

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Proceedings Article | 14 May 2019 Paper

Mode-selective read-in integrated circuit with improved input range for infrared scene projectors

Min Ji Cho, Hee Chul Lee

Proceedings Volume 11001, 1100119 (2019) https://doi.org/10.1117/12.2518578

KEYWORDS: Transistors, Thermography, Infrared imaging, Infrared radiation, Integrated circuits, Projection systems, Imaging systems, Multiplexers, Digital electronics, Analog electronics

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Proceedings Article | 3 May 2017 Paper

A read-in IC for infrared scene projectors with voltage drop compensation for improved uniformity of emitter current

Uisub Shin, Min Ji Cho, Hee Chul Lee

Proceedings Volume 10178, 1017807 (2017) https://doi.org/10.1117/12.2256111

KEYWORDS: Switches, Transistors, Capacitors, Data conversion, Infrared radiation, Projection systems, Integrated circuits, Analog electronics

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Proceedings Article | 3 May 2017 Paper

Hybrid-mode read-in integrated circuit for infrared scene projectors

Min Ji Cho, Uisub Shin, Hee Chul Lee

Proceedings Volume 10178, 1017808 (2017) https://doi.org/10.1117/12.2261933

KEYWORDS: Infrared imaging, Infrared radiation, Integrated circuits, Projection systems, Switches, Temperature metrology, Transistors

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SPIE Journal Paper | 3 April 2014 Open Access

Analytical model for the electro-thermal feedback effect in a microbolometer infrared focal plane array

Seung-Man Park, Seungoh Han, Hee Chul Lee

OE, Vol. 53, Issue 04, 043104, (April 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.4.043104

KEYWORDS: Microbolometers, Infrared radiation, Resistance, Thermal modeling, Staring arrays, Integrated modeling, Thermography, Infrared imaging, Temperature metrology, Thermal analysis

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Proceedings Article | 18 June 2013 Paper

Nickel-oxide film as an AR coating of Si window for IR sensor packaging

Hyunbin Shim, Dongsoo Kim, Ingu Kang, Jinkwan Kim, Hee Chul Lee

Proceedings Volume 8704, 870420 (2013) https://doi.org/10.1117/12.2013929

KEYWORDS: Silicon, Transmittance, Semiconducting wafers, Long wavelength infrared, Annealing, Antireflective coatings, Coating, Infrared sensors, Nickel, Germanium

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Proceedings Article | 31 May 2012 Paper

The estimation of thermal properties of μ-bolometers in a FPA with some selected structures and pitches

Seung-man Park, Seungoh Han, Chang Suk Han, Hee Chul Lee

Proceedings Volume 8353, 83531J (2012) https://doi.org/10.1117/12.919623

KEYWORDS: Bolometers, Microbolometers, Finite element methods, Metals, Thermal analysis, Thermography, Temperature metrology, Error analysis, Staring arrays, Defense technologies

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Proceedings Article | 12 May 2012 Paper

A photo-sensor on thin polysilicon membrane embedded in wafer level package LED

Jin Kwan Kim, Hee Chul Lee

Proceedings Volume 8431, 843121 (2012) https://doi.org/10.1117/12.921623

KEYWORDS: Light emitting diodes, Semiconducting wafers, Silicon, Electrodes, Metals, Sensors, Packaging, LED lighting, Optical testing, Low pressure chemical vapor deposition

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Proceedings Article | 21 May 2011 Paper

Electric characteristic of nickel oxide film for the mirobolometer

Yong Soo Lee, Dong Soo Kim, Young-Chul Jung, Hee Chul Lee

Proceedings Volume 8012, 80121P (2011) https://doi.org/10.1117/12.886913

KEYWORDS: Nickel, Oxides, Oxygen, Microbolometers, Heat treatments, Metals, Resistance, Sputter deposition, Amorphous silicon, Oxidation

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Proceedings Article | 21 May 2011 Paper

A self-protecting uncooled microbolometer structure for uncooled microbolometer

Youngmin Jo, Il-Woong Kwon, Dong Soo Kim, Hyun Bin Shim, Hee Chul Lee

Proceedings Volume 8012, 80121O (2011) https://doi.org/10.1117/12.884432

KEYWORDS: Microbolometers, Resistance, Sensors, Infrared radiation, Vanadium, Aluminum, Oxides, Temperature metrology, Silica, Thermography

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Proceedings Article | 4 May 2010 Paper

Properties of reactively sputtered nickel oxide films as a microbolometer sensing material

Dong Soo Kim, Il Woong Kwon, Chi Ho Hwang, Hee Chul Lee, Yong Soo Lee

Proceedings Volume 7660, 76601B (2010) https://doi.org/10.1117/12.850243

KEYWORDS: Nickel, Oxides, Thin films, Microbolometers, Oxygen, Resistance, Amorphous silicon, Bolometers, Metals, Electrical engineering

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Proceedings Article | 4 May 2010 Paper

Radiation hardening of low-noise readout integrated circuit for infrared focal plane arrays

Min Su Lee, Yong Soo Lee, Hee Chul Lee

Proceedings Volume 7660, 76603W (2010) https://doi.org/10.1117/12.849963

KEYWORDS: Readout integrated circuits, Gamma radiation, Infrared radiation, Infrared cameras, Infrared imaging, Thermography, Silicon, Staring arrays, Integrated circuit design, Oxides

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Proceedings Article | 7 May 2009 Paper

HgCdTe technologies in South Korea

Sooho Bae, Han Jung, Sun Ho Kim, Nam Hwan Kim, Seung-Man Park, Hee Chul Lee

Proceedings Volume 7298, 72982Y (2009) https://doi.org/10.1117/12.818110

KEYWORDS: Mercury cadmium telluride, Readout integrated circuits, Diodes, Infrared detectors, Photovoltaics, Sensors, Indium, Detector development, Zinc, Staring arrays

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Proceedings Article | 7 May 2009 Paper

Thin nickel oxide films for micro-bolometers

Dong Soo Kim, Il Woong Kwon, Yong Soo Lee, Hee Chul Lee

Proceedings Volume 7298, 72980O (2009) https://doi.org/10.1117/12.820153

KEYWORDS: Nickel, Oxides, Resistance, Thin films, Amorphous silicon, Bolometers, Oxygen, Infrared radiation, Sensors, Atomic force microscopy

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Proceedings Article | 1 May 2008 Paper

CMOS readout integrated circuit involving pixel-level ADC for microbolometer FPAs

C. Hwang, I. Kwon, Y. Lee, H. Lee

Proceedings Volume 6940, 694029 (2008) https://doi.org/10.1117/12.780466

KEYWORDS: Microbolometers, Amplifiers, Readout integrated circuits, Capacitors, CMOS technology, Interference (communication), Signal to noise ratio, Analog electronics, Capacitance, Negative feedback

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Proceedings Article | 16 April 2008 Paper

A high fill-factor uncooled infrared detector with low noise characteristic

Il Woong Kwon, Jong Eun Kim, Chi Ho Hwang, Yong Soo Lee, Hee Chul Lee

Proceedings Volume 6940, 694014 (2008) https://doi.org/10.1117/12.780506

KEYWORDS: Infrared detectors, Electrodes, Aluminum, Capacitance, Infrared radiation, Thermography, Silica, Sensors, Temperature metrology, Capacitors

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Proceedings Article | 14 May 2007 Paper

Pixelwise readout integrated circuits with pixel-level ADC for microbolometers

C. H. Hwang, C. B. Kim, Y. S. Lee, B. G. Yu, H. C. Lee

Proceedings Volume 6542, 654221 (2007) https://doi.org/10.1117/12.719155

KEYWORDS: Microbolometers, Capacitors, Readout integrated circuits, Amplifiers, Digital signal processing, CMOS technology, Signal processing, Digital electronics, Capacitance, Device simulation

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Proceedings Article | 14 May 2007 Paper

A high SNR readout circuit design for TDI array with adaptive charge capacity control

Chul Bum Kim, Chi Ho Hwang, Yong Soo Lee, Hee Chul Lee

Proceedings Volume 6542, 65423U (2007) https://doi.org/10.1117/12.719143

KEYWORDS: Signal to noise ratio, Capacitors, Satellites, Sensors, Adaptive control, Infrared imaging, Clouds, Satellite imaging, Infrared radiation, Capacitance

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Proceedings Article | 14 May 2007 Paper

A high fill-factor uncooled infrared detector with thermomechanical bimaterial structure

Il Woong Kwon, Jong Eun Kim, Chi Ho Hwang, Tae Sik Kim, Yong Soo Lee, Hee Chul Lee

Proceedings Volume 6542, 65421O (2007) https://doi.org/10.1117/12.719207

KEYWORDS: Capacitance, Infrared radiation, Infrared detectors, Electrodes, Thermography, Capacitors, Aluminum, Thermal effects, Sensors, Temperature metrology

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Proceedings Article | 18 May 2006 Paper

An analysis of gamma radiation effects on ZnS- and CdTe-passivated HgCdTe photodiodes

Min Yung Lee, Young Ho Kim, Nam Ho Lee, Yong Soo Lee, Siva Sivananthan, Hee Chul Lee

Proceedings Volume 6206, 62062J (2006) https://doi.org/10.1117/12.665500

KEYWORDS: Photodiodes, Mercury cadmium telluride, Zinc, Diodes, Gamma radiation, Infrared radiation, Radiation effects, Infrared photography, Photodetectors, Mid-IR

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Proceedings Article | 12 October 2005 Paper

Design of readout circuit with noise tolerant edge detection for InSb MWIR detector

Chul Bum Kim, Doo Hyung Woo, Yong Soo Lee, Hee Chul Lee

Proceedings Volume 5987, 59870O (2005) https://doi.org/10.1117/12.629648

KEYWORDS: Edge detection, Sensors, Mid-IR, Analog electronics, Capacitors, Nonuniformity corrections, Detection and tracking algorithms, Infrared detectors, Image processing, Logic

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Proceedings Article | 12 October 2005 Paper

Readout integrated circuit for microbolometer with an analog non-uniformity correction

C. Hwang, D. Woo, Y. Lee, H. Lee

Proceedings Volume 5987, 59870P (2005) https://doi.org/10.1117/12.630755

KEYWORDS: Microbolometers, Readout integrated circuits, Digital signal processing, Analog electronics, Infrared radiation, Infrared imaging, Imaging systems, Resistance, Nonuniformity corrections, Edge detection

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Proceedings Article | 30 August 2004 Paper

Novel surface treatment of HgCdTe using hydrazine

Min Yung Lee, Hee Chul Lee

Proceedings Volume 5406, (2004) https://doi.org/10.1117/12.542042

KEYWORDS: Mercury cadmium telluride, Diodes, Cadmium, Mercury, Tellurium, Metals, Long wavelength infrared, Photodiodes, Ellipsometry, Surface finishing

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Proceedings Article | 2 February 2004 Paper

Focal plane readout for 2-D LWIR application implemented with current mode background suppression per pixel

Doo Hyung Woo, Sang Gu Kang, Hee Chul Lee

Proceedings Volume 5234, (2004) https://doi.org/10.1117/12.514157

KEYWORDS: Sensors, Amplifiers, Long wavelength infrared, Staring arrays, Infrared radiation, Infrared detectors, Transistors, Capacitors, Mercury cadmium telluride, Switches

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Proceedings Article | 2 February 2004 Paper

Infrared focal plane array readout integrated circuit with on-chip 14b A/D converter

Sang-Gu Kang, Doo Woo, Hee Lee

Proceedings Volume 5234, (2004) https://doi.org/10.1117/12.514113

KEYWORDS: Capacitors, Amplifiers, Staring arrays, Readout integrated circuits, Analog electronics, Infrared detectors, Infrared radiation, Detector arrays, Sensors, Clocks

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Proceedings Article | 23 January 2003 Paper

Noise bandwidth suppression circuit for low-noise IRFPA

Byunghyuck Kim, Sang-Gu Kang, Hee Chul Lee, Choong-Ki Kim

Proceedings Volume 4820, (2003) https://doi.org/10.1117/12.451959

KEYWORDS: Amplifiers, Cadmium sulfide, Field effect transistors, Capacitors, Switching, Sensors, Atrial fibrillation, Capacitance, Linear filtering, Resistance

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Proceedings Article | 5 December 2002 Paper

Electrochemical CdTe deposition for HgCdTe surface passivation

Jong-Hwa Choi, Hee Chul Lee

Proceedings Volume 4795, (2002) https://doi.org/10.1117/12.453820

KEYWORDS: Mercury cadmium telluride, Cadmium, Tellurium, Electrodes, Interfaces, Nitrogen, Ions, Photodiodes, Semiconducting wafers, Capacitors

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Proceedings Article | 10 October 2001 Paper

Junction formation by hydrogenation for HgCdTe diodes

Keedong Yang, Jong Hwa Choi, Soo Ho Bae, Hee Chul Lee

Proceedings Volume 4369, (2001) https://doi.org/10.1117/12.445305

KEYWORDS: Mercury cadmium telluride, Diodes, Semiconducting wafers, Plasma, Hydrogen, Mercury, Chemical species, Photodiodes, Doping, Ion implantation

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Proceedings Article | 17 July 2000 Paper

Novel concept of TDI readout circuit for LWIR detector

Byunghyuck Kim, Nanyoung Yoon, Hee Chul Lee, Choong-Ki Kim

Proceedings Volume 4028, (2000) https://doi.org/10.1117/12.391729

KEYWORDS: Sensors, Capacitors, Device simulation, Long wavelength infrared, Electronics, CMOS sensors, Staring arrays, Infrared sensors, Signal to noise ratio, Calibration

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Proceedings Article | 17 July 2000 Paper

Surface treatment effects on the surface recombination velocity of ZnS/HgCdTe interface

Jong Hwa Choi, Hee Chul Lee, MinSung Choi

Proceedings Volume 4028, (2000) https://doi.org/10.1117/12.391752

KEYWORDS: Diodes, Mercury cadmium telluride, Etching, Interfaces, Capacitors, Electrodes, Oxides, Zinc, Resistance, Surface finishing

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SPIE Journal Paper | 1 May 2000

A condition on the spatial resolution of IR collimators for testing of thermal imaging systems

Krzysztof Chrzanowski, Hee Chul Lee, Wieslaw Wrona

OE, Vol. 39, Issue 05, (May 2000) https://doi.org/10.1117/12.10.1117/1.602507

KEYWORDS: Collimators, Thermography, Spatial resolution, Imaging systems, Infrared imaging, Modulation transfer functions, Diffraction, Image resolution, Infrared radiation, Optical components

Proceedings Article | 26 October 1998 Paper

Effects of post-implantation annealing on LWIR HgCdTe diode characteristics

Soo Ho Bae, Young-Ho Kim, Hee Chul Lee, Choong-Ki Kim

Proceedings Volume 3436, (1998) https://doi.org/10.1117/12.328005

KEYWORDS: Annealing, Diodes, Mercury cadmium telluride, Photodiodes, Electro optical modeling, Diffusion, Long wavelength infrared, Liquid phase epitaxy, Statistical analysis, Solids

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Proceedings Article | 26 October 1998 Paper

Improvement of Hg0.78Cd0.22Te diode characteristics by hydrogenation

Young-Ho Kim, Soo Ho Bae, Choong-Ki Kim, Hee Chul Lee

Proceedings Volume 3436, (1998) https://doi.org/10.1117/12.328004

KEYWORDS: Annealing, Diodes, Semiconducting wafers, Mercury, Diffusion, Mercury cadmium telluride, Indium, Liquid phase epitaxy, Thermal effects, Photovoltaics

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Proceedings Article | 26 October 1998 Paper

HgCdTe-based quantum device nanofabrication

C. Lee, Jung Choi, J. Yook, S. Lee, K. Park, Soo Ho Bae, Hee Chul Lee, Choong-Ki Kim, Tae Kang, Jin-Ki Hong, Sun-Ung Kim, Mann-Jang Park

Proceedings Volume 3436, (1998) https://doi.org/10.1117/12.328073

KEYWORDS: Nanofabrication, Electron beam lithography, Quantum dots, Zinc, Nanolithography, Scanning electron microscopy, Electrons, Nanostructures, Mercury cadmium telluride, Interfaces

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Proceedings Article | 13 August 1997 Paper

New reflow process for indium bump

Young-Ho Kim, Jong Hwa Choi, Kang-Sik Choi, Hee Chul Lee, Choong-Ki Kim

Proceedings Volume 3061, (1997) https://doi.org/10.1117/12.280315

KEYWORDS: Indium, Plasma, Mercury cadmium telluride, Etching, Scanning electron microscopy, Optical spheres, Reliability, Silicon, Image processing, Indium oxide

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Proceedings Article | 13 August 1997 Paper

New unit cell of current mirroring direct injection circuit for focal plane arrays

Nanyoung Yoon, Byunghyuck Kim, Hee Chul Lee, Hyungchul Shin, Choong-Ki Kim

Proceedings Volume 3061, (1997) https://doi.org/10.1117/12.280328

KEYWORDS: Sensors, Field effect transistors, Transistors, Amplifiers, Staring arrays, Charge-coupled devices, Capacitors, Mirrors, Capacitance, Semiconducting wafers

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Proceedings Article | 13 August 1997 Paper

Suppression of reverse bias tunneling current in HgCdTe photodiodes formed by rapid thermal diffusion

Seung-Man Park, Jae Mook Kim, Hee Chul Lee, Choong-Ki Kim

Proceedings Volume 3061, (1997) https://doi.org/10.1117/12.280325

KEYWORDS: Photodiodes, Diodes, Mercury cadmium telluride, Diffusion, Indium, Ions, Quantum efficiency, Temperature metrology, Optical amplifiers, Liquid phase epitaxy

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Proceedings Article | 13 August 1997 Paper

Improvement in HgCdTe diode characteristics by flip-chip bonded annealing

Soo Ho Bae, Young-Ho Kim, Kwan Kim, Hee Chul Lee, Choong-Ki Kim

Proceedings Volume 3061, (1997) https://doi.org/10.1117/12.280327

KEYWORDS: Annealing, Diodes, Mercury cadmium telluride, Diffusion, Electro optical modeling, Photodiodes, Fabrication, Ion implantation, Mercury, Sodium

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Showing 5 of 38 publications

Conference Committee Involvement (17)

Infrared Technology and Applications XLVII

12 April 2021 | Online Only, Florida, United States

Infrared Technology and Applications XLVI

27 April 2020 | Online Only, California, United States

Infrared Technology and Applications XLV

14 April 2019 | Baltimore, MD, United States

Infrared Technology and Applications XLIV

16 April 2018 | Orlando, FL, United States

Infrared Technology and Applications XLIII

9 April 2017 | Anaheim, CA, United States

Infrared Technology and Applications XLII

18 April 2016 | Baltimore, MD, United States

Infrared Technology and Applications XLI

20 April 2015 | Baltimore, MD, United States

Infrared Technology and Applications XL

5 May 2014 | Baltimore, MD, United States

Infrared Technology and Applications XXXIX

29 April 2013 | Baltimore, Maryland, United States

Infrared Technology and Applications XXXVIII

23 April 2012 | Baltimore, Maryland, United States

Infrared Technology and Applications XXXVII

25 April 2011 | Orlando, Florida, United States

Infrared Technology and Applications XXXVI

5 April 2010 | Orlando, Florida, United States

Infrared Technology and Applications XXXV

13 April 2009 | Orlando, Florida, United States

Infrared Technology and Applications XXXIV

17 March 2008 | Orlando, Florida, United States

Infrared Technology and Applications XXXIII

9 April 2007 | Orlando, Florida, United States

Infrared Technology and Applications XXX

12 April 2004 | Orlando, Florida, United States

Infrared Technology and Applications XXIX

21 April 2003 | Orlando, Florida, United States

Showing 5 of 17 Conference Committees

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