Dr. Jari Nikkinen
at Modulight Inc
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 12 March 2024 Presentation + Paper
R. Ulkuniemi, A. Schramm, V. Vilokkinen, J. Nikkinen, P. Uusimaa
Proceedings Volume 12867, 128670Z (2024) https://doi.org/10.1117/12.2691906
KEYWORDS: Quantum processes, Semiconductor lasers, Quantum emitters, Quantum devices, Industrial applications, Quantum applications

Proceedings Article | 19 July 2022 Paper
Riina Ulkuniemi, Petri Melanen, Jari Nikkinen, Jari Ovaskainen, Petteri Uusimaa
Proceedings Volume 12243, 122430F (2022) https://doi.org/10.1117/12.2635439
KEYWORDS: Semiconductor lasers, Diodes, Antireflective coatings, Reflectivity, Waveguides, Near infrared, Lithium, Coating, Quantum wells, Quantum information

Proceedings Article | 2 March 2022 Presentation + Paper
Riina Ulkuniemi, Petri Melanen, Jari Nikkinen, Jari Ovaskainen, Petteri Uusimaa
Proceedings Volume 12015, 1201504 (2022) https://doi.org/10.1117/12.2608605
KEYWORDS: Semiconductor lasers, Antireflective coatings, Quantum computing, Surgery, Near infrared, Photons, Optical testing, Manufacturing, Laser stabilization, Laser applications

Proceedings Article | 5 March 2021 Presentation + Paper
Jari Nikkinen, Soile Talmila, Ville Vilokkinen, Petri Melanen, Antti Saarela, Lasse Orsila, Jari Sillanpää, Petteri Uusimaa, Seppo Orsila
Proceedings Volume 11668, 116680A (2021) https://doi.org/10.1117/12.2577745
KEYWORDS: Fiber lasers, Semiconductor lasers, Reliability, Manufacturing, Optical resonators, Optical design, Materials processing, Laser processing, Laser manufacturing

Proceedings Article | 5 March 2021 Presentation + Paper
K. Nechay, R. Ulkuniemi, A. Filipchuk, T. Hartikainen, V. Kaivosoja, R. Hietikko, J. Nikkinen, J. Sillanpaa, P. Melanen, V. Vilokkinen, S. Talmila, P. Uusimaa
Proceedings Volume 11668, 116680R (2021) https://doi.org/10.1117/12.2577229
KEYWORDS: Vertical cavity surface emitting lasers, 3D surface sensing, Three dimensional sensing, Oxides, Thermal oxidation, Structured light, Sensors, Semiconductors, Semiconducting wafers, Oxidation

Showing 5 of 6 publications
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