Mr. Masaki Koshiishi Profile

Masaki Koshiishi

at Japan Aerospace Exploration Agency

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 15 July 2008 Paper

An analog baseband feedback circuit for TES signals in frequency domain multiplexing

Noriko Yamasaki, Kazuhisa Mitsuda, Yoh Takei, Kensuke Masui, Toshishige Hagihara, Shunsuke Kimura, Masaki Koshiishi, Ikuyuki Mitsuishi, Keisuke Shinozaki, Akihiro Tsuchiya, Tomotaka Yoshino, Hiroshi Yoshitake, Ryuichi Fujimoto, Yoshitaka Ishisaki

Proceedings Volume 7011, 70113Q (2008) https://doi.org/10.1117/12.788134

KEYWORDS: Analog electronics, Amplifiers, Sensors, Phase shifts, Feedback signals, Multiplexing, Modulation, Magnetism, Switches, Fused deposition modeling

Read Abstract +

Proceedings Article | 3 October 2007 Paper

The first light of a single-stage MEMS x-ray optic

Masaki Koshiishi, Yuichiro Ezoe, Makoto Mita, Yoshitomo Maeda, Kazuhisa Mitsuda, Masaki Suzuki, Takeyuki Osawa, Akio Hoshino, Yoshitaka Ishisaki, Takayuki Takano, Ryutaro Maeda

Proceedings Volume 6688, 668814 (2007) https://doi.org/10.1117/12.733912

KEYWORDS: X-ray optics, Mirrors, X-rays, Silicon, Wafer-level optics, Microelectromechanical systems, Semiconducting wafers, Etching, Reflectivity, Reflection

Read Abstract +

Proceedings Article | 13 June 2006 Paper

Recent development of micropore optics using MEMS technologies

Yuichiro Ezoe, Masaki Koshiishi, Makoto Mita, Kazuhisa Mitsuda, Yoshitaka Ishisaki, Akio Hoshino, Zhen Yang, Takayuki Takano, Harutaka Mekaru, Ryutaro Maeda

Proceedings Volume 6266, 62661B (2006) https://doi.org/10.1117/12.670736

KEYWORDS: Silicon, Semiconducting wafers, Etching, Microelectromechanical systems, X-rays, X-ray optics, Wafer-level optics, Mirrors, Optics manufacturing, Oxides

Read Abstract +

Proceedings Article | 8 September 2005 Paper

Research and development of MEMS x-ray optics

Yuichiro Ezoe, Kazuhisa Mitsuda, Makoto Mita, Masaki Koshiishi, Yoshitaka Ishisaki, Keisuke Shinozaki, Akio Hoshino

Proceedings Volume 5900, 590013 (2005) https://doi.org/10.1117/12.616517

KEYWORDS: Semiconducting wafers, X-rays, X-ray optics, Microelectromechanical systems, Silicon, Mirrors, Wafer-level optics, Surface roughness, Reflectivity, Spatial resolution

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years