Pei-Ying Lin
at KLA Taiwan
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 November 2024 Poster + Paper
Maxwel Lee, Eric Wang, Ken Yang, Colbert Lu, Elton Lin, Connie Lin, Pei-Ying Lin, Adrian Li, Dongsheng Fan
Proceedings Volume 13216, 132162B (2024) https://doi.org/10.1117/12.3034607
KEYWORDS: Inspection, Industry, Manufacturing, Semiconductors, Particles, Optical proximity correction, Lead, Artificial intelligence, Mask making, Reticles, Defect inspection, Optical inspection, Inspection equipment

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