Prof. Shing-Chung Wang
Professor at National Yang Ming Chiao Tung Univ.
SPIE Involvement:
Track Chair | Author | Instructor
Publications (45)

Proceedings Article | 27 February 2015 Paper
Tsung Sheng Kao, Tzeng-Tsong Wu, Che-Wei Tsao, Jyun-Hao Lin, Da-wei Lin, Shyh-Jer Huang, Tien-Chang Lu, Hao-Chung Kuo, Shing-Chung Wang, Yan-Kuin Su
Proceedings Volume 9372, 93720C (2015) https://doi.org/10.1117/12.2078577
KEYWORDS: Photonic crystals, Gallium nitride, Polarization, Etching, Photomasks, Scanning electron microscopy, Photonic crystal devices, Electrical engineering, Electron beam lithography, Finite-difference time-domain method

Proceedings Article | 27 February 2015 Paper
Proceedings Volume 9372, 937207 (2015) https://doi.org/10.1117/12.2077391
KEYWORDS: Silicon carbide, Reflectors, Nanoimprint lithography, Silicon, Reflectivity, Etching, Scanning electron microscopy, Polarization, Vertical cavity surface emitting lasers, Optical design

Proceedings Article | 27 February 2014 Paper
Proceedings Volume 9001, 90010J (2014) https://doi.org/10.1117/12.2038448
KEYWORDS: Vertical cavity surface emitting lasers, Aluminum nitride, Quantum wells, Numerical analysis, Resistance, Light emitting diodes, Absorption, Gallium nitride, Device simulation, Optical properties

Proceedings Article | 19 February 2014 Paper
Tien-Chang Lu, Shing-Chung Wang, Tzeng-Tsong Wu, Shu-Hsien Wu, Yu-Cheng Syu
Proceedings Volume 8995, 89950E (2014) https://doi.org/10.1117/12.2042064
KEYWORDS: Reflectivity, Polarization, Neodymium, Scattering, Distributed Bragg reflectors, Vertical cavity surface emitting lasers, Resonators, Finite element methods, Gallium nitride, Ions

Proceedings Article | 15 March 2013 Paper
Tzeng-Tsong Wu, Shu-Hsien Wu, Tien-Chang Lu, Hao-Chung Kuo, Shing-Chung Wang
Proceedings Volume 8633, 86330B (2013) https://doi.org/10.1117/12.2002911
KEYWORDS: Reflectivity, Polarization, Vertical cavity surface emitting lasers, Gallium nitride, Neodymium, Electrophoretic light scattering, Electroluminescence, Resonators, Scattering, Ions

Showing 5 of 45 publications
Proceedings Volume Editor (12)

Showing 5 of 12 publications
Conference Committee Involvement (12)
Testing and Reliability of Optelectronic Devices
26 January 2001 | San Jose, CA, United States
Testing, Reliability, and Applications of Optoelectronic Devices
24 January 2001 | San Jose, CA, United States
Testing, Packaging, and Reliability of Semiconductors Lasers V
26 January 2000 | San Jose, CA, United States
Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V
25 January 2000 | San Jose, CA, United States
Testing, Packaging, Reliability, and Applications of SemiconductorLasers IV
28 January 1999 | San Jose, CA, United States
Showing 5 of 12 Conference Committees
Course Instructor
SC053: Testing and Reliability of Semiconductor Lasers
This course covers device physics, testing, lifetime and reliability evaluations of semiconductor lasers. The features of semiconductor lasers that are relevant to the device performance and reliability are briefly reviewed. Various laser characterization methods are described. Techniques for evaluation of laser lifetime and factors affecting laser reliability are discussed. Recent developments in semiconductor lasers are presented in the context of their impact on testing and reliability.
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