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You will have access to both the presentation and article (if available).
Improvement in efficiency droop of GaN-based light-emitting diodes by optimization of active regions
This will count as one of your downloads.
You will have access to both the presentation and article (if available).
This course covers device physics, testing, lifetime and reliability evaluations of semiconductor lasers. The features of semiconductor lasers that are relevant to the device performance and reliability are briefly reviewed. Various laser characterization methods are described. Techniques for evaluation of laser lifetime and factors affecting laser reliability are discussed. Recent developments in semiconductor lasers are presented in the context of their impact on testing and reliability.
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