Dr. Tomofumi Miyauchi
at Renesas Technology Corp
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 1 April 2009 Paper
Takuya Hagiwara, Mamoru Terai, Takeo Ishibashi, Tomofumi Miyauchi, Shinya Hori, Teruhiko Kumada, Tomoya Kumagai, Atsushi Sawano, Kosuke Doi, Takeshi Matsunobe, Naoki Man, Hirofumi Seki, Yusaku Tanahashi, Tetsuro Hanawa
Proceedings Volume 7273, 727324 (2009) https://doi.org/10.1117/12.813643
KEYWORDS: Polymers, Photoresist processing, Semiconducting wafers, Lithography, Coating, Photomasks, Chemical analysis, Critical dimension metrology, Fluorine, Scanners

Proceedings Article | 30 June 2006 Paper
Proceedings Volume 6270, 62701R (2006) https://doi.org/10.1117/12.671446
KEYWORDS: Charge-coupled devices, Manganese, Calibration, X-ray imaging, Spectroscopy, X-rays, Bismuth, Spectral resolution, CCD image sensors, Sensors

Proceedings Article | 17 September 2005 Paper
E. Miyata, N. Anabuki, N. Tawa, K. Mukai, T. Miyauchi, H. Tsunemi, K. Miyaguchi
Proceedings Volume 5922, 59220U (2005) https://doi.org/10.1117/12.615626
KEYWORDS: Charge-coupled devices, X-rays, Hard x-rays, Sensors, Scintillators, Photons, Visible radiation, Bismuth, X-ray detectors, X-ray telescopes

Proceedings Article | 11 October 2004 Paper
Kiyoshi Hayashida, Kennichi Torii, Masaaki Namiki, Takayuki Shiroshoji, Masayuki Shoji, Satoru Katsuda, Daisuke Matsuura, Tomofumi Miyauchi, Hiroshi Tsunemi, Takayoshi Kohmura, Haruyoshi Katayama
Proceedings Volume 5488, (2004) https://doi.org/10.1117/12.552037
KEYWORDS: X-rays, Calibration, Quantum efficiency, Charge-coupled devices, Cameras, Fermium, Frequency modulation, CCD cameras, Spectroscopy, X-ray imaging

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